Ap. Horsfield et P. Clancy, A TIGHT-BINDING MOLECULAR-DYNAMICS SIMULATION OF THE MELTING AND SOLIDIFICATION OF SILICON, Modelling and simulation in materials science and engineering, 2(2), 1994, pp. 277-294
The melting of solid silicon and the cooling of liquid silicon are inv
estigated using molecular dynamics. Both the Stillinger-Weber (SW) pot
ential and the tight-binding bond model are used to calculate the forc
es. The electrical properties are investigated using an empirical pseu
dopotential method with a plane wave basis. The temperature at which t
he solid becomes unstable and passes to the liquid phase is found to b
e about 2300 K. The dependence of this temperature on cell size is inv
estigated. On cooling, there are changes in some of the properties of
the liquid: the energy per particle decreases, the diffusion constant
decreases, and the low-frequency electrical conductivity decreases sli
ghtly as the temperature decreases. Between 1180 K and 980 K the liqui
d undergoes a transition to a glassy phase. There are large changes in
the pair correlation function, the SW three-body energy distribution,
the diffusion constant, the density of electron single-particle state
s and the electrical conductivity. All of these changes are consistent
with increased tetrahedral bonding.