Ongoing work is being carried out at Mintek to establish methods for t
he determination of trace levels of impurities in high-purity noble me
tals and their salts. The sample-preparation methods are outlined, and
the optimum instrumental parameters that were established are tabulat
ed. Spectral interferences arising from the presence of a matrix eleme
nt at high concentration levels, including abundance sensitivity overl
ap and the formation of noble-matrix oxides, are discussed. Accuracy w
as established by the comparison of the results with those obtained by
a DC-arc method, and by spike recovery tests. The precision of measur
ement was found to vary from 0.72 to 49% S(r) for conentrations of bet
ween 15 and 0.5 mug/g, respectively.