One of the most important parameters in characterization of integrated
optical devices is precise determination of the effective cut-off wav
elength of the fundamental and first-order modes, since this sets the
exact region of single-mode operation. This paper describes an experim
ental set-up for determination of cut-off wavelengths of integrated op
tical waveguides, using the technique of spectral light transmission.
Measurement results obtained with Ti:LiNbO3 channel waveguides are pre
sented for straight waveguides, bent waveguides and polarizers.