Av. Kvit et al., CHARACTERIZATION OF THE Z LUMINESCENCE SYSTEM IN HIGH-PURITY CDTE, Materials science & engineering. B, Solid-state materials for advanced technology, 26(1), 1994, pp. 1-5
4.2 K Photoluminescence (PL) bands with unusual spectral properties ha
ve been observed and identified in high purity low-temperature-grown b
ulk polycrystalline CdTe. Two sharp bands dominate at about 1.300 and
1.355 eV in p- and n-type samples respectively (Z centre). Detailed PL
studies including time-resolved measurements are used to define the p
recise Z0/+ energy level in the gap: E(c) - 251 meV or E(v) + 1.355 eV
. By varying the excitation wavelength we find a strong transformation
of the PL spectrum which allows us to compare the shape of the two sp
ectral regions: 1.24-1.36 eV and 1.45-1.57 eV associated with Z-accept
or and conventional donor acceptor recombination respectively. In this
way we defined the second level (Z-/0 transition): E(c) - 206 meV or
E(v) + 1.400 eV. The PL properties of the Z centre, a laser microprobe
mass analysis investigation and correlation with a spin-polarized tig
ht-binding model allow us to suggest that the Z centre originates from
a 3d impurity on a Cd site, most probably Cu.