Je. Johannes et Jg. Ekerdt, RESONANCE-ENHANCED MULTIPHONON IONIZATION OF SILICON PRODUCED DURING DISILANE PYROLYSIS, Journal of applied physics, 76(5), 1994, pp. 3144-3148
Gas phase species generated by thermal decomposition of disilane were
studied using resonance enhanced multiphoton ionization at disilane pr
essures ranging from 1-10 Torr and temperatures ranging from 300-1000
K. Atomic Si, mass 23, was observed at 487.9, 417.7, and 416.2 nm. A m
ass-30 signal was not observed between 494-515 nm. Masses 2, 32, and 6
0 were observed using multiphonon ionization and were photoionization
fragments from higher silanes and silenes. Thermal decomposition react
ions were the main source of atomic Si for the mass-28 signal, althoug
h ionization of SiH2 and higher silanes followed by fragmentation may
have contributed some of the mass-28 signal.