RESONANCE-ENHANCED MULTIPHONON IONIZATION OF SILICON PRODUCED DURING DISILANE PYROLYSIS

Citation
Je. Johannes et Jg. Ekerdt, RESONANCE-ENHANCED MULTIPHONON IONIZATION OF SILICON PRODUCED DURING DISILANE PYROLYSIS, Journal of applied physics, 76(5), 1994, pp. 3144-3148
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
5
Year of publication
1994
Pages
3144 - 3148
Database
ISI
SICI code
0021-8979(1994)76:5<3144:RMIOSP>2.0.ZU;2-#
Abstract
Gas phase species generated by thermal decomposition of disilane were studied using resonance enhanced multiphoton ionization at disilane pr essures ranging from 1-10 Torr and temperatures ranging from 300-1000 K. Atomic Si, mass 23, was observed at 487.9, 417.7, and 416.2 nm. A m ass-30 signal was not observed between 494-515 nm. Masses 2, 32, and 6 0 were observed using multiphonon ionization and were photoionization fragments from higher silanes and silenes. Thermal decomposition react ions were the main source of atomic Si for the mass-28 signal, althoug h ionization of SiH2 and higher silanes followed by fragmentation may have contributed some of the mass-28 signal.