We have measured the light-induced electron spin resonance (LESR) in u
ndoped and N-doped hydrogenated amorphous silicon over a wide range of
excitation intensities. By decomposing the LESR signal into a broad c
omponent, the neutral-dangling-bond component and a narrow component,
we find that the density of neutral dangling bonds (D0) increases unde
r illumination at 77 K in undoped samples in the annealed state and in
N-doped samples in both the annealed and light-soaked states. No satu
ration of the D0 density is seen even at excitation intensities of abo
ut 700 mW/cm2. However, a decrease in the D0 density occurs in undoped
samples in the light-soaked state at excitation intensities below abo
ut 10 mW/cm2. We show that the change of the D0 density under illumina
tion at 77 K can be accounted for qualitatively with a model in which
conversion takes place between dangling bonds in various charge states
.