P. Petre et M. Swaminathan, SPECTRAL-DOMAIN TECHNIQUE USING SURFACE-WAVE EXCITATION FOR THE ANALYSIS OF INTERCONNECTS, IEEE transactions on microwave theory and techniques, 42(9), 1994, pp. 1744-1749
Analysis of interconnects is an area of prime importance in packaging
since the characteristics of the interconnections eventually dictate t
he performance of the package. The analysis consists of two parts, nam
ely, parameter extraction and package simulation where the former repr
esents the computation of the line parameters such as resistance, indu
ctance, capacitance, and conductance (R, L, C, G). At high frequencies
, the line parameters vary with frequency which requires a complete so
lution to Maxwell's equation for parameter extraction. This translates
to the computation of the propagation constant as a function of frequ
ency (beta(omega)) which is the focus of the work in this paper. Since
packages typically consist of periodic structures, the spectral domai
n technique (SDT) lends itself to easy analysis and has therefore been
used in this paper. A new method utilizing the surface wave excitatio
n principle applied to the scattering problem has been used to compute
beta(omega) which is different from the eigenvalue solution that has
been used in the past. Using the present formulation, a single algorit
hm can be used both for the computation of wave propagation and scatte
ring/radiation by changing the angle of the incident wave.