M. Tobisch et al., BACKSCATTERING OF PROJECTILE-BOUND ELECTRONS FROM SOLID-SURFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 86(1-2), 1994, pp. 143-146
The contribution of projectile ionization (PI) to secondary electron e
mission is studied by collision of H-2+ and H-3+ ions (400 keV/u and 7
00 keV/u) with carbon, copper and gold targets (600 angstrom). The mea
sured doubly differential intensity distribution shows a peak of lost
projectile electrons near - upsilon(p). We describe the subtraction of
the contribution of target ionization (TI), and compare the remaining
electron intensities with a BEA calculation. For solids we observe a
strong energy shift of the electron loss peak, which is compared with
the influence of electron transport and binding energy. Furthermore, t
he low energy tail of the electron loss peak indicates the simultaneou
s occurrence of PI and TI. Finally we discuss the influence of surface
conditions and the dependence of the observation angles on the measur
ed electron intensities.