M. Jung et al., CHARGE-STATE ANALYSIS OF HEAVY-IONS AFTER PENETRATION OF UNCLEANED AND SPUTTER CLEANED CONDUCTING SURFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 86(1-2), 1994, pp. 194-196
The evolution of the charge state distribution of fast ions inside a s
olid is of basic interest in various research fields as stopping power
measurements etc. The existing models for the charge state evolution
differ in the treatment of the projectile-exit-surface interaction, wh
ich has a strong influence on the final charge state distributions. We
measured the charge state distributions for C+, N+, and O+ (30 less-t
han-or-equal-to E/M less-than-or-equal-to 130 keV/u) impact on thin C,
Cu, and Au foils, where the surface properties were modified by sputt
er cleaning. The measurments show a pronounced change of the mean proj
ectile charge state to lower values in the case of sputter cleaned sur
faces. This result underlines the importance of the projectile-surface
interaction for the generation of the outcoming charge state distribu
tion.