IN-SITU HYDROGEN CHARGING OF THIN NB FILMS AND DEPTH PROFILING WITH THE H-1(N-15,ALPHA-GAMMA)C-12 NUCLEAR-REACTION

Authors
BLASSER S STEIGER J WEIDINGER A
Citation
S. Blasser et al., IN-SITU HYDROGEN CHARGING OF THIN NB FILMS AND DEPTH PROFILING WITH THE H-1(N-15,ALPHA-GAMMA)C-12 NUCLEAR-REACTION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 24-27
Citations number
6
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
85
Issue
1-4
Year of publication
1994
Pages
24 - 27
Database
ISI
SICI code
0168-583X(1994)85:1-4<24:IHCOTN>2.0.ZU;2-8
Abstract
The hydrogen concentration in Nb films in equilibrium with an external H2-gas was measured by the N-15-NRA method using a differential pumpi ng system. We find that the hydrogen solubility in films is reduced co mpared to that of bulk samples. This can be explained by the clamping of epitaxial films to the substrate. These first direct measurements o f solubility curves for films are in disagreement with earlier investi gations by other authors, who found - based on indirect concentration determinations - an increased solubility in films. We think that the d iscrepancy is due to incorrect concentration determinations in these e arlier studies.