THE MEASUREMENT OF ENHANCED PIXE YIELDS WITH HE-3(2+) IONS

Authors
PEISACH M PINEDA CA PILLAY AE
Citation
M. Peisach et al., THE MEASUREMENT OF ENHANCED PIXE YIELDS WITH HE-3(2+) IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 100-103
Citations number
5
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
85
Issue
1-4
Year of publication
1994
Pages
100 - 103
Database
ISI
SICI code
0168-583X(1994)85:1-4<100:TMOEPY>2.0.ZU;2-5
Abstract
The cause of the high enhancement factor in a PIXE study of metal fluo rides was investigated with singly and doubly charged He-3 ions. A com parison of the X-ray yields and enhancement factors showed that gamma rays from the de-excitation of coulomb excited F-19 ions were not resp onsible for this effect. Charge buildup and subsequent discharge produ ced energetic electrons which generated the large yields of X-rays. Th e energy distribution of these electrons ranged from a low concentrati on at energies around 4 keV, peaked at an energy around 10 keV and ext ended to beyond 30 keV. The importance for PIXE analysis was noted.