M. Nekab et al., A STUDY OF THE IONIZATION OF AL, SI, S, SC, TI AND V BY AR IONS IN THE ENERGY-RANGE 1-5 MEV, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 123-127
Thick elemental targets of Al, Si, S, Sc, Ti and V and compound target
s of P, S, Cl, K and Ca have been irradiated with singly and doubly ch
arged Ar ions. K X-ray yields from target (13 less-than-or-equal-to Z2
less-than-or-equal-to 23) and projectile (Z1 = 18) atoms have been me
asured at energies ranging from 1 to 5 MeV. The K X-ray energy shifts
are examined for both elemental target and projectile atoms. From the
measured yields, the K X-ray production cross sections are calculated
both for target and projectile atoms. Furthermore, the vacancy sharing
between the K levels of the collision partners is examined and compar
ed to theoretical predictions. The bombarding energy dependence of Kbe
ta/Kalpha ratios is determined for the Ar ions and for the metallic ta
rgets.