A PIXE STUDY OF ABNORMAL X-RAYS FROM BINARY FLUORIDES WITH PROTONS INTHE RANGE 0.4-2 MEV

Citation
Rcm. Mboweni et al., A PIXE STUDY OF ABNORMAL X-RAYS FROM BINARY FLUORIDES WITH PROTONS INTHE RANGE 0.4-2 MEV, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 138-141
Citations number
3
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
85
Issue
1-4
Year of publication
1994
Pages
138 - 141
Database
ISI
SICI code
0168-583X(1994)85:1-4<138:APSOAX>2.0.ZU;2-J
Abstract
Previously reported abnormally high X-ray yields from the fluorides of some transition metals were confirmed. Using proton beams and beams o f the molecule-ion H-1(2+), at equivalent proton energies between 400 and 2000 keV the conditions for the production of abnormally high X-ra y yields were studied for the effect of ion beam energy, beam current, charge, target thickness and atomic number of the target metal. The e ffect was probably due to buildup of potential and discharge with the production of a flux of energetic electrons, with an energy distributi on peaking above 10 keV.