PERTURBED ANGULAR-DISTRIBUTION STUDIES IN NATURAL, SYNTHETIC CVD AND HPHT DIAMOND

The time differential perturbed angular distribution (TDPAD) technique as applied to semi-conductors and insulators has a unique place among the other analytical methods involving ion beams. It provides an oppo rtunity to study molecular complex-like systems involving the radioact ive probe, and also in-situ hot atom chemistry. Both of these aspects are important in understanding dopant-impurity dynamics, particularly in the context of ion-implantation. The very recent advances in the sy nthetic growth and the defect engineering of diamond have ensured it w ill be no exception. F-19 TDPAD data for various natural and synthetic diamonds, as well as for some polymer systems, is reviewed in this co ntext, and confirm that F-19 TDPAD could become an extremely sensitive probe of the important but elusive impurity, hydrogen.