V. Havranek et al., PIXE-INP COMPUTER CODE FOR PIXE ANALYSES OF THIN AND THICK SAMPLES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 637-641
The Pascal 6.0 program package PIXE-INP was developed at Institute of
Nuclear Physics (Academy of Sciences of Czech Republic) for quantitati
ve evaluation of PIXE spectra from thin and thick samples. The K-, L-
and M-sensitivities are calculated using semi-empirical and theoretica
l ionization cross sections, tabulated relative X-ray emission probabi
lities, Coster-Kronig and fluorescence yields. The X-ray detector effi
ciency is determined by measuring a set of thin standards with known e
lement content. The package is supplemented with the data bases on X-r
ay attenuation coefficients and proton stopping powers which are neede
d for the calculation of thick sample matrix corrections. The X-ray sp
ectrum evaluation comprises an iterative background removal and non-li
near least squares fitting of X-ray multiplets with Gaussian peak shap
e. The escape and summation peaks are taken into account. The performa
nce of the program package is documented on measurements of reference
materials.