Mbh. Breese et al., A COMPARISON BETWEEN MEV PROTONS AND ALPHA-PARTICLES FOR IBIC ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 790-793
There are two major problems with the IBIC (ion beam induced charge) t
echnique which hampers its wider use for the analysis of semiconductor
materials. The small measured charge pulses give a low signal to nois
e ratio, and ion induced damage limits the maximum ion dose which can
be used to form an IBIC image. This paper investigates the different c
harge pulse heights obtained using MeV protons and alpha particles, an
d the rate at which the ion induced damage decreases the measured char
ge pulse height.