STRUCTURAL BEHAVIOR OF DIRECT-CURRENT SPUTTERED AND THERMALLY EVAPORATED MOLYBDENUM THIN-FILMS

Citation
S. Kacim et al., STRUCTURAL BEHAVIOR OF DIRECT-CURRENT SPUTTERED AND THERMALLY EVAPORATED MOLYBDENUM THIN-FILMS, Thin solid films, 249(2), 1994, pp. 150-154
Citations number
31
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
249
Issue
2
Year of publication
1994
Pages
150 - 154
Database
ISI
SICI code
0040-6090(1994)249:2<150:SBODSA>2.0.ZU;2-X
Abstract
Mo films were deposited on sintered polycrystalline MgO. These films e xhibited, depending on deposition conditions, two different structures , namely the normal body-centered cubic and an abnormal face-centered cubic. The analysis performed by electron diffraction and Auger electr on spectroscopy indicated that the fee structure assumed by molybdenum is an impurity-stabilized phase rather than a simple polymorphic tran sformation or dimolybdenum nitride (gamma Mo2N) as previously stated b y some authors.