ATOMIC-FORCE MICROSCOPY ADHESION MEASUREMENTS OF SURFACE-MODIFIED TONERS FOR XEROGRAPHIC APPLICATIONS

Authors
OTT ML MIZES HA
Citation
Ml. Ott et Ha. Mizes, ATOMIC-FORCE MICROSCOPY ADHESION MEASUREMENTS OF SURFACE-MODIFIED TONERS FOR XEROGRAPHIC APPLICATIONS, Colloids and surfaces. A, Physicochemical and engineering aspects, 87(3), 1994, pp. 245-256
Citations number
13
Categorie Soggetti
Chemistry Physical
Journal title
Colloids and surfaces. A, Physicochemical and engineering aspects → ACNP
ISSN journal
09277757
Volume
87
Issue
3
Year of publication
1994
Pages
245 - 256
Database
ISI
SICI code
0927-7757(1994)87:3<245:AMAMOS>2.0.ZU;2-A
Abstract
We have used an atomic force microscope to measure the adhesion of sur face-modified toner particles to various surfaces of relevance to xero graphy. We will present adhesion data on several toner and toner surfa ce additive surface modification techniques and use supporting machine performance data to discuss the advantages and disadvantages of the t echniques.