DYNAMIC IDD TEST CIRCUIT FOR MIXED-SIGNAL ICS

Authors
ARGUELLES J MARTINEZ M BRACHO S
Citation
J. Arguelles et al., DYNAMIC IDD TEST CIRCUIT FOR MIXED-SIGNAL ICS, Electronics Letters, 30(6), 1994, pp. 485-486
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
30
Issue
6
Year of publication
1994
Pages
485 - 486
Database
ISI
SICI code
0013-5194(1994)30:6<485:DITCFM>2.0.ZU;2-V
Abstract
Built-in test circuitry is proposed that uses the dynamic supply curre nt consumption of a mixed signal circuit under test for a unified faul t detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry.