LOCAL TEXTURE MEASUREMENTS WITH THE SCANNING ELECTRON-MICROSCOPE

Techniques for convenient measurement of the crystallographic orientat ion of small volumes in bulk samples by electron diffraction in the SE M are discussed. They make use of Selected Area Electron Channelling P atterns (SAECP) and Electron Back Scattering Patterns (EBSP). The prin ciple of pattern formation as well as measuring and evaluation procedu re are introduced. The methods offer a viable procedure for obtaining information on the spatial arrangement of orientations, i.e. on orient ation topography. Thus, they provide a new level of information on cry stallographic texture. An application of the techniques for local text ure measurements is demonstrated by an example, namely for investigati on of considering the recrystallization behaviour of binary Al-1.3%Mn with large precipitates. Finally, further developments of the EBSP tec hnique are addressed.