CHARACTERIZATION OF SPRAYED CDSB2S4 THIN-FILMS BY PHOTOELECTROCHEMICAL METHOD

Citation
Ch. Bhosale et al., CHARACTERIZATION OF SPRAYED CDSB2S4 THIN-FILMS BY PHOTOELECTROCHEMICAL METHOD, Indian Journal of Pure & Applied Physics, 32(3), 1994, pp. 267-269
Citations number
NO
Categorie Soggetti
Physics
ISSN journal
00195596
Volume
32
Issue
3
Year of publication
1994
Pages
267 - 269
Database
ISI
SICI code
0019-5596(1994)32:3<267:COSCTB>2.0.ZU;2-H
Abstract
Films of CdSb2S4 have been prepared onto FTO coated glass substrates b y spray pyrolysis technique at optimised substrate temperature and sol ution concentration. A photoelectrochemical cell with configuration: n -CdSb2S4/Electrolyte/C was formed. Using Gartner's theory, the calcula ted values of various semiconductor parameters were found to be: (1) t he majority carrier density = 3 x 10(15) cm-3, (2) minority carrier di ffusion length = 0.38 mu, (3) quantum efficiency = 2.2% and (4) bandga p energy = 1.65 eV. These results are in good agreement with those obt ained from other physical methods of characterisation.