Ab. Swartzlander et al., COMPOSITIONAL ANALYSIS OF CDS SNO2 FILMS AFTER HEAT-TREATMENTS AND CDCL2 PRETREATMENTS/, Surface and interface analysis, 21(2), 1994, pp. 160-162
We used Auger electron spectroscopy (AES) to perform a systematic stud
y of CdS thin films grown from solution on SnO2-coated glass. The effe
cts of heat treatments and CdCl2 pretreatments on the stoichiometry of
the CdS and the diffusivity of the CdS/SnO2 interface have been inves
tigated. The results show that CdS thin films not treated in CdCl2 bec
ome sulphur-deficient with heat treatments above 350-degrees-C, where
CdS thin films treated in CdCl2 must be heated above 350-degrees-C to
be smooth and stoichiometric. We did not observe interdiffusion of ato
mic species at the CdS/SnO2 interface after heat treatments of 350, 45
0 or 550-degrees-C.