SINGLE-BEAM PHOTOREFLECTANCE MICROSCOPY SYSTEM WITH ELECTRONIC FEEDBACK

Authors
SUDDENDORF MB SOMEKH MG
Citation
Mb. Suddendorf et Mg. Somekh, SINGLE-BEAM PHOTOREFLECTANCE MICROSCOPY SYSTEM WITH ELECTRONIC FEEDBACK, Electronics Letters, 30(5), 1994, pp. 398-399
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
30
Issue
5
Year of publication
1994
Pages
398 - 399
Database
ISI
SICI code
0013-5194(1994)30:5<398:SPMSWE>2.0.ZU;2-V
Abstract
A new photoreflectance (PR) system which uses only a single optical be am is described. The PR signal is detected at the second harmonic of t he modulation frequency, contained in the backreflected light. To reli ably measure this small signal, the second harmonic content of the inc ident beam is reduced by feedback to the modulator.