CONTACT ETCHING OF GAP SUBSTRATES BY GA-IN-P-AS SATURATED SOLUTION DURING LIQUID-PHASE HETEROEPITAXY

Authors
Citation
Jm. Olchowik, CONTACT ETCHING OF GAP SUBSTRATES BY GA-IN-P-AS SATURATED SOLUTION DURING LIQUID-PHASE HETEROEPITAXY, Physica status solidi. a, Applied research, 144(2), 1994, pp. 363-369
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
144
Issue
2
Year of publication
1994
Pages
363 - 369
Database
ISI
SICI code
0031-8965(1994)144:2<363:CEOGSB>2.0.ZU;2-O
Abstract
The results of a theoretical and experimental analysis of isothermal c ontact etching of GaP substrate by Ga-In-P-As saturated solution are p resented. Using the model of interatomic interaction at the interface during isothermal exposure of liquid and solid phases, conditions for thermodynamic quasiequilibrium of the above system are determined. Con sidering mass balance for the conditions of coherent lattice deformati on of the interface, the amount of contact etching of GaP substrate du ring typical conditions of liquid phase heteroepitaxy of GaxIn1-xPyAs1 -y layers is quantitatively determined.