ANALYSIS OF DISCONTINUOUS-LAYER PROPAGATION STRUCTURES BY TRANSVERSE RESONANCE METHOD

Authors
AUBRION M AUBERT H AHMADPANAH M BAUDRAND H
Citation
M. Aubrion et al., ANALYSIS OF DISCONTINUOUS-LAYER PROPAGATION STRUCTURES BY TRANSVERSE RESONANCE METHOD, Electronics Letters, 29(24), 1993, pp. 2086-2087
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
29
Issue
24
Year of publication
1993
Pages
2086 - 2087
Database
ISI
SICI code
0013-5194(1993)29:24<2086:AODPSB>2.0.ZU;2-Y
Abstract
The transverse resonance method is used for the accurate analysis of p ropagation structures with discontinuous substrate layers. The origina l aspect of the approach is the use of LSE-LSM modes as basis function s combined with appropriate trial functions which leads to small-size matrices and reduces the numerical effort. As an example the propagati on characteristics of a microslab waveguide with finite metallisation thickness are calculated.