THE TOMOGRAPHIC ATOM-PROBE - NEW DIMENSIONS IN MATERIALS ANALYSIS

Authors
DECONIHOUT B CHAMBERLAND S BLAVETTE D
Citation
B. Deconihout et al., THE TOMOGRAPHIC ATOM-PROBE - NEW DIMENSIONS IN MATERIALS ANALYSIS, Advanced materials, 6(9), 1994, pp. 695-698
Citations number
12
Categorie Soggetti
Material Science
Journal title
Advanced materials → ACNP
ISSN journal
09359648
Volume
6
Issue
9
Year of publication
1994
Pages
695 - 698
Database
ISI
SICI code
0935-9648(1994)6:9<695:TTA-ND>2.0.ZU;2-4
Abstract
The tomographic atom probe (TAP) is the most advanced of the three-dim ensional atom probes currently in use. Atom probes are unique in that both the lateral and the depth resolution are high. The general develo pment of atom probes and the principle of operation of the TAP, in whi ch the sample is field evaporated atomic layer by atomic layer, are ou tlined. The analysis of a nickel base superalloy is given as an exampl e of an application in metallurgy.