PHOTOTHERMAL BENDING SPECTROSCOPY - BENDING EFFECT OF FILM SUBSTRATE BY THERMAL-EXPANSION/

Authors
GOTOH T NONOMURA S HIRATA S NITTA S
Citation
T. Gotoh et al., PHOTOTHERMAL BENDING SPECTROSCOPY - BENDING EFFECT OF FILM SUBSTRATE BY THERMAL-EXPANSION/, Progress in Natural Science, 6, 1996, pp. 34-37
Citations number
7
Categorie Soggetti
Multidisciplinary Sciences
Journal title
Progress in Natural Science → ACNP
ISSN journal
10020071
Volume
6
Year of publication
1996
Supplement
S
Pages
34 - 37
Database
ISI
SICI code
1002-0071(1996)6:<34:PBS-BE>2.0.ZU;2-Z
Abstract
A new photothermal method for low optical absorption measurements, pho tothermal bending spectroscopy (PBS), has been proposed. It is based o n the bending effect of film deposited on a substrate due to different ial thermal expansion. The film/substrate system acts as a bimorph and therefore when the film is heated a large displacement at the edge of the sample due to bending can be optically detected. This technique i s demonstrated and compared with different methods.