ZnO thin films have been grown in atmospheric pressure and ambient atm
ospheric air using zinc 2-ethyl hexanoate as zinc source by metalorgan
ic chemical vapor deposition technique. The films grown on glass above
350-degrees-C showed c-axis orientation as seen from x-ray diffractio
n studies. The films were highly transparent and free from any visual
defects. The growth rate and morphology of the film was found to depen
d on the substrate temperature. Auger electron spectroscopy shows the
presence of carbon as an impurity.