MASKLESS PATTERNING OF SILICON SURFACE-BASED ON SCANNING TUNNELING MICROSCOPE TIP-INDUCED ANODIZATION AND CHEMICAL ETCHING

Citation
H. Sugimura et al., MASKLESS PATTERNING OF SILICON SURFACE-BASED ON SCANNING TUNNELING MICROSCOPE TIP-INDUCED ANODIZATION AND CHEMICAL ETCHING, Applied physics letters, 65(12), 1994, pp. 1569-1571
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
12
Year of publication
1994
Pages
1569 - 1571
Database
ISI
SICI code
0003-6951(1994)65:12<1569:MPOSSO>2.0.ZU;2-#
Abstract
A microprocessing method for silicon (Si) without photolithography is proposed. The method consists of only two processes. Hydrogen-terminat ed Si surfaces (Si-H) were first locally anodized using scanning tunne ling microscopy (STM). The non-anodized surfaces were then etched chem ically in potassium hydroxide solution. The anodic oxide produced with the first process performed as an etching mask. The height of the etc hed pattern of approximately 50 nm was much larger than the thickness of the anodic oxide. Humidity effect on STM tip-induced anodization of Si-H is also shown. The area of the anodization was enlarged with inc reasing humidity, and the spatial resolution became worse.