Hydrogen (H) ingress into two copper (Cu)-nickel (Ni) alloys - a comme
rcial 77% Cu-15% Ni alloy (aged) and alloy K-500 (UNS N05500, aged and
unaged) - was studied using a technique referred to as hydrogen ingre
ss analysis by potentiostatic pulsing (HIAPP). Anodic current transien
ts obtained for these alloys in an acetate buffer (1 mol L(-1) acetic
acid + 1 mol L(-1) sodium acetate [NaAc]) were analyzed using a diffus
ion-trapping model to determine trapping constants and H entry fluxes.
A small increase was observed in the irreversible trapping constant f
or alloy K-500 with aging. Trapping constants of the aged alloys were
similar within the limits of uncertainty but H entry flux for the 77%
Cu alloy was lower than that for aged or unaged alloy K-500. The lower
flux may have accounted, at least partly, for the Cu alloy's higher r
esistance to H embrittlement. Trap densities were consistent qualitati
vely with levels of sulfur (S) and phosphorus (P) in the two alloys. T
his finding supported an assumption that S and P provided the primary
irreversible traps.