ELECTRICAL CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS OF MERCURY CADMIUM TELLURIDE BY VARIABLE-MAGNETIC-FIELD HALL MEASUREMENTS
Js. Kim et al., ELECTRICAL CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS OF MERCURY CADMIUM TELLURIDE BY VARIABLE-MAGNETIC-FIELD HALL MEASUREMENTS, Semiconductor science and technology, 9(9), 1994, pp. 1696-1705
We report a method for a new classification procedure for liquid-phase
epitaxially grown mercury cadmium telluride single crystals. Variable
-magnetic-field Hall measurements are performed on nine liquid-phase e
pitaxially grown Hg0.78Cd0.22Te single-crystal films for magnetic fiel
ds from 0 to 1.4 T and in the temperature range from 10 K to 300 K. Th
e data from these measurements are analysed in the context of the redu
ced-conductivity-tensor scheme proposed by Kim and co-workers. Based o
n the degree of deviation from an ideal one-carrier behaviour, these e
xperimental samples are classified into several types to emphasize the
transition in the behaviour of the normal to anomalous n-type samples
, finally leading to p-type samples. Our classification is also based
on a general trend in the temperature dependence of the mobility and d
ensity of the majority carriers, which were extracted from the magneto
resistivity data. The classification provides a useful benchmark for m
aterials characterization in the infrared detector industry.