ELECTRICAL CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS OF MERCURY CADMIUM TELLURIDE BY VARIABLE-MAGNETIC-FIELD HALL MEASUREMENTS

Citation
Js. Kim et al., ELECTRICAL CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS OF MERCURY CADMIUM TELLURIDE BY VARIABLE-MAGNETIC-FIELD HALL MEASUREMENTS, Semiconductor science and technology, 9(9), 1994, pp. 1696-1705
Citations number
32
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
9
Issue
9
Year of publication
1994
Pages
1696 - 1705
Database
ISI
SICI code
0268-1242(1994)9:9<1696:ECOLEG>2.0.ZU;2-W
Abstract
We report a method for a new classification procedure for liquid-phase epitaxially grown mercury cadmium telluride single crystals. Variable -magnetic-field Hall measurements are performed on nine liquid-phase e pitaxially grown Hg0.78Cd0.22Te single-crystal films for magnetic fiel ds from 0 to 1.4 T and in the temperature range from 10 K to 300 K. Th e data from these measurements are analysed in the context of the redu ced-conductivity-tensor scheme proposed by Kim and co-workers. Based o n the degree of deviation from an ideal one-carrier behaviour, these e xperimental samples are classified into several types to emphasize the transition in the behaviour of the normal to anomalous n-type samples , finally leading to p-type samples. Our classification is also based on a general trend in the temperature dependence of the mobility and d ensity of the majority carriers, which were extracted from the magneto resistivity data. The classification provides a useful benchmark for m aterials characterization in the infrared detector industry.