Photothermal measurements at varied modulation frequencies allow for t
he estimation of depth profiles of thermal diffusivity or thermal cond
uctivity in case of known thermal density. Knowledge of thermal conduc
tivity k is important because of its correlation to relevant microstru
ctural properties of the samples under test as for instance mechanical
hardness of steel. We suggest an inversion algorithm performing a seq
uence of one-parameter fits in order to estimate k profiles. Surface p
roblems in photothermal depth profiling and a approach to overcome the
m are discussed. Experimental results of thermal conductivity depth pr
ofiling of laser-hardened steel, based on this inversion algorithm are
presented. The photothermally obtained k-profiles are interpreted and
compared with results from conventional destructive measuring techniq
ues.