TEMPERATURE-DEPENDENCE OF THE RESISTANCE OF ONE-DIMENSIONAL METAL-FILMS WITH DOMINANT NYQUIST PHASE BREAKING

We report the results of a comprehensive study of the temperature depe ndences of the resistance of one-dimensional narrow gold films with re spect to the effects of weak localization (WL) and electron-electron i nteraction (EEI) in a wide temperature range. The electron wave-functi on coherence for such samples is limited by electron-electron collisio ns with small energy transfer (the Nyquist phase-breaking mechanism). It is shown that the temperature dependence of the WL contribution to the resistance, obtained for such a case, is in excellent agreement wi th the theory by Altshuler, Aronov, and Khmelnitskii. The experimental dependences DELTAR (T) for one-dimensional samples are described quan titatively by the sum of the WL contribution, the contribution of the singlet part of the diffusion channel of EEI, and the contribution of the quantum interference between electron-phonon and electron-impurity scattering.