QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS

Citation
F. Yubero et al., QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS, Surface and interface analysis, 22(1-12), 1994, pp. 124-128
Citations number
27
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
22
Issue
1-12
Year of publication
1994
Pages
124 - 128
Database
ISI
SICI code
0142-2421(1994)22:1-12<124:QORSOZ>2.0.ZU;2-V
Abstract
The dielectric loss function of ZrO2 over 0-80 eV has been determined from a quantitative analysis of reflection electron energy loss spectr a (REELS) at different primary energies. From this, the inelastic elec tron mean free path for 200-2000 eV electrons in ZrO2 has been calcula ted. The inelastic mean free path (IMPF) is found to depend on the dep th from which the electron is backscattered. For great depths, the IMF P approaches a constant value which is the same as that which would be obtained within a model that ignores the effects of the surface. The derived IMFP values have been compared to different formulae presented in the literature and the TPP2 formula due to Tanuma et al. is found to give the best agreement with the present results.