F. Yubero et al., QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS, Surface and interface analysis, 22(1-12), 1994, pp. 124-128
The dielectric loss function of ZrO2 over 0-80 eV has been determined
from a quantitative analysis of reflection electron energy loss spectr
a (REELS) at different primary energies. From this, the inelastic elec
tron mean free path for 200-2000 eV electrons in ZrO2 has been calcula
ted. The inelastic mean free path (IMPF) is found to depend on the dep
th from which the electron is backscattered. For great depths, the IMF
P approaches a constant value which is the same as that which would be
obtained within a model that ignores the effects of the surface. The
derived IMFP values have been compared to different formulae presented
in the literature and the TPP2 formula due to Tanuma et al. is found
to give the best agreement with the present results.