XPS AND AES STUDY OF AL2O3 TI6AL4V INTERFACE - INFLUENCE OF OXIDATIONAND NITRURATION OF THE METAL-SURFACE/

Citation
P. Delogu et al., XPS AND AES STUDY OF AL2O3 TI6AL4V INTERFACE - INFLUENCE OF OXIDATIONAND NITRURATION OF THE METAL-SURFACE/, Surface and interface analysis, 22(1-12), 1994, pp. 236-241
Citations number
12
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
22
Issue
1-12
Year of publication
1994
Pages
236 - 241
Database
ISI
SICI code
0142-2421(1994)22:1-12<236:XAASOA>2.0.ZU;2-4
Abstract
Important properties of the coating/substrate combination like hardnes s, stress and, in particular, adhesion rely partly on the morphology a nd microstructure of the interface, which is often physically and chem ically different from the substrate as well as from the coating. The a im of this work is to study the influence of the chemical state of the metal surface on the structure of the interface Al2O3/Ti6A14V, obtain ed by deposition via sputtering of the ceramic. For this purpose three different surface treatments of the substrate were performed: air oxi dation, cleaning by Ar+ sputtering and nitrogen ion implantation. The chemical composition of the treated surfaces was assessed by x-ray pho toelectron spectroscopy, while the composition of the interfaces was i nvestigated by Auger electron spectroscopy depth profiling.