Vp. Parkhutik et al., IN-DEPTH INHOMOGENEOUS PHOTOLUMINESCENT PROPERTIES OF POROUS SILICON LAYERS, Surface and interface analysis, 22(1-12), 1994, pp. 358-362
Chemical composition and photoluminescence of free-standing porous sil
icon (PS) layers produced by anodization of p-Si in aqueous HF solutio
ns at high current densities (J(a) = 50 mA cm-2) are studied. It is sh
own that the PS layers are enriched in oxide phase, presumably due to
silicic acid formation during the pore growth. Chemical composition of
PS films produced at current densities about 100-150 mA cm-2 is non-u
niform: internal faces of PS samples contain more silicon atoms than e
xternal. Their luminescent properties are also asymmetrical: the exter
nal face of the PS layer emits less light than the internal one. The s
amples grown at current densities above 200 mA cm-2 do not exhibit asy
mmetry of chemical composition and luminescence. The obtained results
are considered based on existing models for PS luminescence and it is
shown that the quantum confinement and siloxene-based models may fit t
he present data.