XPS-INVESTIGATION OF TITANIUM-MODIFIED MFI-TYPE ZEOLITES

Citation
I. Grohmann et al., XPS-INVESTIGATION OF TITANIUM-MODIFIED MFI-TYPE ZEOLITES, Surface and interface analysis, 22(1-12), 1994, pp. 403-406
Citations number
12
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
22
Issue
1-12
Year of publication
1994
Pages
403 - 406
Database
ISI
SICI code
0142-2421(1994)22:1-12<403:XOTMZ>2.0.ZU;2-I
Abstract
The chemical bonding of titanium in MFI-type zeolites (Ti-silicalite) has been investigated using x-ray photoelectron spectroscopy (XPS). Di fferent titanium silicalites as well as pure titania (anatase) have be en analysed. We have found a distinctively higher binding energy of th e Ti 2p photoelectrons in Ti-silicalite than in titania- or anatase-co ntaining silicalite. Ti has the same oxidation state in all solids und er study. We attribute the difference in binding energy to different o xygen coordinations of the titanium in the framework of Ti-silicalite (tetrahedral) and anatase (octahedral). This suggestion is supported b y XPS-studies of TiO2-SiO2 glasses and TiO2-SiO2 mixed oxides where a similar shift was found. Additional Raman-spectroscopic investigations of the samples indicate the existence of tetrahedrally coordinated ti tanium by the appearance of a characteristic band at approximately 965 cm-1. Non-framework TiO2 species containing octahedrally coordinated titanium could also be distinguished by XPS. Further Ti incorporation is indicated by the expansion of the unit cell which is related to the Ti 2p intensity for the framework titanium.