NONDESTRUCTIVE CHARACTERIZATION OF CHROMIUM PHOSPHATE COATED ALUMINUMWITH SE AND FTIRS CORRELATED TO SURFACE ANALYTICAL ANALYSES BY AES AND TEM

Authors
GOEMINNE G DELAET J TERRYN H VEREECKEN J
Citation
G. Goeminne et al., NONDESTRUCTIVE CHARACTERIZATION OF CHROMIUM PHOSPHATE COATED ALUMINUMWITH SE AND FTIRS CORRELATED TO SURFACE ANALYTICAL ANALYSES BY AES AND TEM, Surface and interface analysis, 22(1-12), 1994, pp. 445-450
Citations number
17
Categorie Soggetti
Chemistry Physical
Journal title
Surface and interface analysis → ACNP
ISSN journal
01422421
Volume
22
Issue
1-12
Year of publication
1994
Pages
445 - 450
Database
ISI
SICI code
0142-2421(1994)22:1-12<445:NCOCPC>2.0.ZU;2-V
Abstract
Non-destructive optical investigations (SE and FTIRS) of chromium phos phate conversion layers on aluminum are correlated to AES and TEM inve stigations. The AES results support the duplex model of the structure. FTIR-spectra provide a non-destructive characterization in agreement with the Auger data. Fitting the SE-data with a proper model makes it possible to determine the thickness accurately. A correlation is made between the thickness obtained with SE, FTIRS and AES. It is shown tha t for thin layers a good agreement is obtained.