CHARACTERIZATION OF ELECTRONIC TRANSPORT-PROPERTIES IN SEMICONDUCTORSBY SCANNING PHOTOTHERMAL MICROSCOPY

Citation
I. Barbereau et al., CHARACTERIZATION OF ELECTRONIC TRANSPORT-PROPERTIES IN SEMICONDUCTORSBY SCANNING PHOTOTHERMAL MICROSCOPY, Progress in Natural Science, 6, 1996, pp. 479-482
Citations number
12
Categorie Soggetti
Multidisciplinary Sciences
Journal title
ISSN journal
10020071
Volume
6
Year of publication
1996
Supplement
S
Pages
479 - 482
Database
ISI
SICI code
1002-0071(1996)6:<479:COETIS>2.0.ZU;2-A
Abstract
In this paper we demonstrate that a photothermal microscopy experiment can be used to determine the electronic diffusivity (or carrier mobil ity). The main difficulty lies in the fact that in order to separate t hermal and carrier diffusion, the experiment must be performed for a r elatively large distance between the pump and probe beams. Phototherma l signals are therefore rather weak and great experimental care must b e taken. Wk present and. discuss experimental results on Si.