PARTIAL AND TOTAL MULTIPHOTON DETACHMENT RATES FOR H- IN A PERTURBATIVE B-SPLINE-BASED APPROACH

Authors
Citation
Hw. Vanderhart, PARTIAL AND TOTAL MULTIPHOTON DETACHMENT RATES FOR H- IN A PERTURBATIVE B-SPLINE-BASED APPROACH, Physical review. A, 50(3), 1994, pp. 2508-2516
Citations number
41
Categorie Soggetti
Physics
Journal title
ISSN journal
10502947
Volume
50
Issue
3
Year of publication
1994
Pages
2508 - 2516
Database
ISI
SICI code
1050-2947(1994)50:3<2508:PATMDR>2.0.ZU;2-4
Abstract
An ab initio approach has been applied to study multiphoton detachment rates for the negative hydrogen ion in the lowest nonvanishing order of perturbation theory. The approach is based on the use of B splines allowing an accurate treatment of the electronic repulsion. Total deta chment rates have been determined for two- to six-photon processes as well as partial rates for detachment into the different final symmetri es. It is shown that B-spline expansions can yield accurate continuum and bound-state wave functions in a very simple manner. The calculated total rates for two- and three-photon detachment are in good agreemen t with other perturbative calculations. For more than three-photon det achment little information has been available before now. While the to tal cross sections show little structure, a fair amount of structure i s predicted in the partial cross sections. In the two-photon process, it is shown that the detached electrons mainly have s character. For f our-and six-photon processes, the contribution from the d channel is t he most important. For three-and five-photon processes p electrons dom inate the electron emission spectrum. Detachment rates for s and p ele ctrons show minima as a function of photon energy.