ABSORPTION-SPECTROSCOPY AT THE CU-2P EDGES IN CU SI(111)7X7 INTERFACE/

Citation
S. Iacobucci et al., ABSORPTION-SPECTROSCOPY AT THE CU-2P EDGES IN CU SI(111)7X7 INTERFACE/, Solid state communications, 91(12), 1994, pp. 989-992
Citations number
16
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
91
Issue
12
Year of publication
1994
Pages
989 - 992
Database
ISI
SICI code
0038-1098(1994)91:12<989:AATCEI>2.0.ZU;2-Z
Abstract
We report on a study of the empty states at the Cu/Si(111)7 x 7 interf ace via polarization-dependent Cu L(2,3) X-ray absorption spectrescopy (XAS) as a function of the Cu coverage (0.25-5ML). Joint analysis of the CuL(3) XAS line-shapes of Cu-based reference compounds allows us t o interpret the high coverage spectra in terms of pseudo-stoichiometri c Cu-silicides.