Hy. Zhu, X-RAY-DIFFRACTION STUDY OF THE T-TO-M PHASE-TRANSFORMATION IN 12-MOL-PERCENT-CERIA-DOPED ZIRCONIA AT LOW-TEMPERATURES, Journal of the American Ceramic Society, 77(9), 1994, pp. 2458-2460
The t-to-m phase transformation in a 12-mol%-ceria-doped zirconia at s
ubzero temperatures was studied in situ by XRD with a cryogenic sample
stage. It mas found that the t-to-m transformation continuously proce
eded to 30 vol% as the temperature decreased to 125 K, when a burstlik
e transformation suddenly occurred with a transformation to 75 vol%. A
preferred orientation of the (<(1)over bar 11>)(m) plane parallel to
the surface during the preburst transformation and XRD line broadening
of both m and t phases after the burst were observed. The preburst tr
ansformation, which has not been revealed by previous dilatometry stud
ies, is explained as surface martensitic transformation. This surface
transformation occurs at higher temperatures than the burstlike transf
ormation due to less matrix constraint and the higher probability of n
ucleation.