QUANTITATIVE-ANALYSIS OF INTEGRATED-OPTIC WAVE-GUIDE SPECTROMETERS

Authors
DERI RJ KALLMAN JS DIJAILI SP
Citation
Rj. Deri et al., QUANTITATIVE-ANALYSIS OF INTEGRATED-OPTIC WAVE-GUIDE SPECTROMETERS, IEEE photonics technology letters, 6(2), 1994, pp. 242-244
Citations number
14
Categorie Soggetti
Optics,"Physics, Applied
Journal title
IEEE photonics technology letters → ACNP
ISSN journal
10411135
Volume
6
Issue
2
Year of publication
1994
Pages
242 - 244
Database
ISI
SICI code
1041-1135(1994)6:2<242:QOIWS>2.0.ZU;2-5
Abstract
We show how scalar diffraction theory can be used to quantitatively ev aluate insertion losses in integrated optic spectrometers based on pla nar waveguide and etched grating technologies. This approach is applie d to optimize the loss-limited spectral operating range of these devic es. We also show how limitations in the photolithographic process used for grating definition can result in appreciable spectrometer inserti on losses.