MODULATED PROBE BEAM REFLECTION - A NEW TECHNIQUE TO MEASURE HIGH TRANSIENT TEMPERATURES

Citation
C. Gruss et al., MODULATED PROBE BEAM REFLECTION - A NEW TECHNIQUE TO MEASURE HIGH TRANSIENT TEMPERATURES, Progress in Natural Science, 6, 1996, pp. 673-676
Citations number
8
Categorie Soggetti
Multidisciplinary Sciences
Journal title
ISSN journal
10020071
Volume
6
Year of publication
1996
Supplement
S
Pages
673 - 676
Database
ISI
SICI code
1002-0071(1996)6:<673:MPBR-A>2.0.ZU;2-9
Abstract
A new experimental technique which relies on the detection of the ther moreflectance signal has been applied to measure transient high temper ature differences. In contrast to the usual thermoreflectance techniqu e, which is used for the thermal characterization of solids and which is based on a modulated pump beam, we here modulate the probe beam, in order to increase the transient signal-to-noise ratio. Test measureme nts done on samples like Si and Cu show that the thermoreflectance sig nal is linear with the sample surface temperature, even for several hu ndred degree of temperature differences.