SIMS ANALYSIS OF DEUTERIUM DISTRIBUTION IN PALLADIUM COATINGS ON PUREIRON

Authors
BRASS AM CHENE J BOUTRYFORVEILLE A
Citation
Am. Brass et al., SIMS ANALYSIS OF DEUTERIUM DISTRIBUTION IN PALLADIUM COATINGS ON PUREIRON, Corrosion science, 36(4), 1994, pp. 707-716
Citations number
16
Categorie Soggetti
Metallurgy & Mining
Journal title
Corrosion science → ACNP
ISSN journal
0010938X
Volume
36
Issue
4
Year of publication
1994
Pages
707 - 716
Database
ISI
SICI code
0010-938X(1994)36:4<707:SAODDI>2.0.ZU;2-3
Abstract
Deuterium profiling was performed by secondary ion mass spectrometry ( SIMS) after cathodic charging, on palladium-coated pure iron, with an without ion sputtering of the surface before the palladium deposition. The influence of aging at 20, 250 and 400 degrees C on the deuterium concentration in the palladium coating and in the bulk material was in vestigated. Deuterium trapping occurred at the Pd/Fe interface and the deuterium concentration was a function of the amount of oxygen at the interface.