InAs (100) surfaces cleaned by the UV-ozone method or by Br-MeOH etchi
ng were annealed under an As flux. By Auger electron spectroscopy (AES
) and reflection high energy electron diffraction (RHEED), we compare
the quality of these surfaces before and after annealing. We show that
the UV-ozone process, unlike Br-MeOH etching, produces a capping oxid
e which desorbs. We study this desorption as a function of temperature
and show that, at 510-degrees-C, the layer is removed. The surface is
then oxygen and carbon free. It is therefore more appropriate for gro
wth than the surface obtained by Br-MeOH etching, which is always cont
aminated by carbon.