EXTENSION OF ELLIPSOMETRY TO THE CASE OF HIGH-REFLECTANCE SMALL SAMPLES AND LONG-WAVELENGTH RADIATION

Authors
SUSHKOV AB TISHCHENKO EA
Citation
Ab. Sushkov et Ea. Tishchenko, EXTENSION OF ELLIPSOMETRY TO THE CASE OF HIGH-REFLECTANCE SMALL SAMPLES AND LONG-WAVELENGTH RADIATION, Optika i spektroskopia, 76(3), 1994, pp. 456-462
Citations number
15
Categorie Soggetti
Spectroscopy,Optics
Journal title
Optika i spektroskopia → ACNP
ISSN journal
00304034
Volume
76
Issue
3
Year of publication
1994
Pages
456 - 462
Database
ISI
SICI code
0030-4034(1994)76:3<456:EOETTC>2.0.ZU;2-E