Y. Jeon et al., X-RAY-ABSORPTION STUDIES OF THE D-ORBITAL OCCUPANCIES OF SELECTED 4D 5D TRANSITION-METALS COMPOUNDED WITH GROUP-III/IV LIGANDS/, Physical review. B, Condensed matter, 50(10), 1994, pp. 6555-6563
X-ray-absorption spectroscopy (XAS) is used to explore the systematic
variations in the 4d/5d transition-metal {T = Au, Pt, Ir, Re, Pd, Ag}
d-orbital occupancy in binary T-X compounds {X = Al, Ga, In, Si, Ge, S
n}. Specifically, the strength of the white line (WL) feature at the T
-L2,3 edges is used to quantify the changes in the d-orbital occupancy
induced by T-X bond formation. Systematic chemical trends in bonding-
induced d-orbital-occupancy changes, evidenced by the data, are discus
sed. A charge-transfer scale (C scale) is developed to approximately s
ummarize the number of T-d holes created in all of the T1-xXx compound
s studied. Comparison with the electronegativity scale emphasizes that
, although the C scale deals with a more restricted type of charge tra
nsfer, it provides insight into the T-X bonding that is not contained
in the traditional scale.