Based on a systematic experimental study of the resistivity of high-qu
ality single crystals of (La1-xSrx2CuO4, a phenomenological approach i
s proposed in which the dissipation for the direction perpendicular to
the superconducting layers is explained by thermal fluctuations of th
e phase in Josephson junctions. By introducing an effective junction a
rea A(H,T), an analytical expression for the resistivity is formulated
, with which the c-axis resistivity as a function of T, H, and theta (
angle between H and the basal plane) can be very well explained.