Sh. Tessmer et al., INTEGRATED CRYOGENIC SCANNING-TUNNELING-MICROSCOPY AND SAMPLE PREPARATION SYSTEM, Review of scientific instruments, 65(9), 1994, pp. 2855-2859
A scanning tunneling microscope (STM) operable from room temperature t
o 1.5 K with an integrated sample preparation chamber has been constru
cted and successfully tested. Both the sample and the tunneling tip ca
n be cleaned and/or modified in a UHV processing chamber which is conn
ected at the top of a liquid-helium flow cryostat. The STM is mounted
to a threaded rod inside the cryostat so that it can be translated ver
tically. This allows a newly prepared sample/tip to be transferred ont
o the STM and lowered into a cryogenic environment without breaking va
cuum, minimizing surface contamination which causes significant tunnel
ing problems at cryogenic temperatures.