INTEGRATED CRYOGENIC SCANNING-TUNNELING-MICROSCOPY AND SAMPLE PREPARATION SYSTEM

Citation
Sh. Tessmer et al., INTEGRATED CRYOGENIC SCANNING-TUNNELING-MICROSCOPY AND SAMPLE PREPARATION SYSTEM, Review of scientific instruments, 65(9), 1994, pp. 2855-2859
Citations number
10
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
65
Issue
9
Year of publication
1994
Pages
2855 - 2859
Database
ISI
SICI code
0034-6748(1994)65:9<2855:ICSASP>2.0.ZU;2-P
Abstract
A scanning tunneling microscope (STM) operable from room temperature t o 1.5 K with an integrated sample preparation chamber has been constru cted and successfully tested. Both the sample and the tunneling tip ca n be cleaned and/or modified in a UHV processing chamber which is conn ected at the top of a liquid-helium flow cryostat. The STM is mounted to a threaded rod inside the cryostat so that it can be translated ver tically. This allows a newly prepared sample/tip to be transferred ont o the STM and lowered into a cryogenic environment without breaking va cuum, minimizing surface contamination which causes significant tunnel ing problems at cryogenic temperatures.